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    Author information
    First name: Ken
    Last name: Mai
    DBLP: 20/513
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    Conference paper
    Yu Cai, Saugata Ghose, Yixin Luo, Ken Mai, Onur Mutlu, Erich F. Haratsch.
    Vulnerabilities in MLC NAND Flash Memory Programming: Experimental Analysis, Exploits, and Mitigation Techniques.
    2017 IEEE International Symposium on High Performance Computer Architecture, HPCA 2017, Austin, TX, USA, February 4-8, 2017 2017 (0) 2017
    Conference paper
    Yu Cai, Ken Mai, Onur Mutlu.
    Comparative evaluation of FPGA and ASIC implementations of bufferless and buffered routing algorithms for on-chip networks.
    Sixteenth International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, CA, USA, March 2-4, 2015 2015 (0) 2015
    Conference paper
    Yu Cai, Yixin Luo, Erich F. Haratsch, Ken Mai, Onur Mutlu.
    Data retention in MLC NAND flash memory: Characterization, optimization, and recovery.
    21st IEEE International Symposium on High Performance Computer Architecture, HPCA 2015, Burlingame, CA, USA, February 7-11, 2015 2015 (0) 2015
    Conference paper
    Yu Cai, Gulay Yalcin, Onur Mutlu, Erich F. Haratsch, Osman S. Unsal, Adrián Cristal, Ken Mai.
    Neighbor-cell assisted error correction for MLC NAND flash memories.
    ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS '14, Austin, TX, USA - June 16 - 20, 2014 2014 (0) 2014
    Conference paper
    Yu Cai, Onur Mutlu, Erich F. Haratsch, Ken Mai.
    Program interference in MLC NAND flash memory: Characterization, modeling, and mitigation.
    2013 IEEE 31st International Conference on Computer Design, ICCD 2013, Asheville, NC, USA, October 6-9, 2013 2013 (0) 2013
    Conference paper
    Yu Cai, Erich F. Haratsch, Onur Mutlu, Ken Mai.
    Threshold voltage distribution in MLC NAND flash memory: characterization, analysis, and modeling.
    Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013 2013 (0) 2013
    Conference paper
    Yu Cai, Gulay Yalcin, Onur Mutlu, Erich F. Haratsch, Adrián Cristal, Osman S. Unsal, Ken Mai.
    Flash correct-and-refresh: Retention-aware error management for increased flash memory lifetime.
    30th International IEEE Conference on Computer Design, ICCD 2012, Montreal, QC, Canada, September 30 - Oct. 3, 2012 2012 (0) 2012
    Conference paper
    Yu Cai, Erich F. Haratsch, Onur Mutlu, Ken Mai.
    Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis.
    2012 Design, Automation Test in Europe Conference Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012 2012 (0) 2012
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