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    Author information
    First name: Erich F.
    Last name: Haratsch
    DBLP: 31/1400
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    Conference paper
    Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu.
    Enabling Accurate and Practical Online Flash Channel Modeling for Modern MLC NAND Flash Memory.
    IEEE Journal on Selected Areas in Communications 2016, Volume 34 (0) 2016
    Conference paper
    Yu Cai, Yixin Luo, Erich F. Haratsch, Ken Mai, Onur Mutlu.
    Data retention in MLC NAND flash memory: Characterization, optimization, and recovery.
    21st IEEE International Symposium on High Performance Computer Architecture, HPCA 2015, Burlingame, CA, USA, February 7-11, 2015 2015 (0) 2015
    Conference paper
    Yu Cai, Gulay Yalcin, Onur Mutlu, Erich F. Haratsch, Osman S. Unsal, Adrián Cristal, Ken Mai.
    Neighbor-cell assisted error correction for MLC NAND flash memories.
    ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS '14, Austin, TX, USA - June 16 - 20, 2014 2014 (0) 2014
    Conference paper
    Yu Cai, Onur Mutlu, Erich F. Haratsch, Ken Mai.
    Program interference in MLC NAND flash memory: Characterization, modeling, and mitigation.
    2013 IEEE 31st International Conference on Computer Design, ICCD 2013, Asheville, NC, USA, October 6-9, 2013 2013 (0) 2013
    Conference paper
    Yu Cai, Erich F. Haratsch, Onur Mutlu, Ken Mai.
    Threshold voltage distribution in MLC NAND flash memory: characterization, analysis, and modeling.
    Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013 2013 (0) 2013
    Conference paper
    Yu Cai, Gulay Yalcin, Onur Mutlu, Erich F. Haratsch, Adrián Cristal, Osman S. Unsal, Ken Mai.
    Flash correct-and-refresh: Retention-aware error management for increased flash memory lifetime.
    30th International IEEE Conference on Computer Design, ICCD 2012, Montreal, QC, Canada, September 30 - Oct. 3, 2012 2012 (0) 2012
    Conference paper
    Yu Cai, Erich F. Haratsch, Onur Mutlu, Ken Mai.
    Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis.
    2012 Design, Automation Test in Europe Conference Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012 2012 (0) 2012
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