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    Author information
    First name: Yixin
    Last name: Luo
    DBLP: 47/11029
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    Conference paper
    Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu.
    Enabling Accurate and Practical Online Flash Channel Modeling for Modern MLC NAND Flash Memory.
    IEEE Journal on Selected Areas in Communications 2016, Volume 34 (0) 2016
    Journal article
    Yixin Luo, Sriram Govindan, Bikash Sharma, Mark Santaniello, Justin Meza, Aman Kansal, Jie Liu, Badriddine M. Khessib, Kushagra Vaid, Onur Mutlu.
    Heterogeneous-Reliability Memory: Exploiting Application-Level Memory Error Tolerance.
    CoRR 2016, Volume 0 (0) 2016
    Conference paper
    Yu Cai, Yixin Luo, Saugata Ghose, Onur Mutlu.
    Read Disturb Errors in MLC NAND Flash Memory: Characterization, Mitigation, and Recovery.
    45th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2015, Rio de Janeiro, Brazil, June 22-25, 2015 2015 (0) 2015
    Conference paper
    Yixin Luo, Yu Cai, Saugata Ghose, Jongmoo Choi, Onur Mutlu.
    WARM: Improving NAND flash memory lifetime with write-hotness aware retention management.
    IEEE 31st Symposium on Mass Storage Systems and Technologies, MSST 2015, Santa Clara, CA, USA, May 30 - June 5, 2015 2015 (0) 2015
    Conference paper
    Yu Cai, Yixin Luo, Erich F. Haratsch, Ken Mai, Onur Mutlu.
    Data retention in MLC NAND flash memory: Characterization, optimization, and recovery.
    21st IEEE International Symposium on High Performance Computer Architecture, HPCA 2015, Burlingame, CA, USA, February 7-11, 2015 2015 (0) 2015
    Conference paper
    Yixin Luo, Sriram Govindan, Bikash Sharma, Mark Santaniello, Justin Meza, Aman Kansal, Jie Liu, Badriddine M. Khessib, Kushagra Vaid, Onur Mutlu.
    Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.
    44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2014, Atlanta, GA, USA, June 23-26, 2014 2014 (0) 2014
    Conference paper
    Vivek Seshadri, Yoongu Kim, Chris Fallin, Donghyuk Lee, Rachata Ausavarungnirun, Gennady Pekhimenko, Yixin Luo, Onur Mutlu, Phillip B. Gibbons, Michael A. Kozuch, Todd C. Mowry.
    RowClone: fast and energy-efficient in-DRAM bulk data copy and initialization.
    The 46th Annual IEEE/ACM International Symposium on Microarchitecture, MICRO-46, Davis, CA, USA, December 7-11, 2013 2013 (0) 2013
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