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Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis.

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    Publication properties
    Title: Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis.
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    Date: 2012
    Publication type: Conference paper
    Authors:
    No. First name Last name Show
    1. Yu Cai
    2. Erich F. Haratsch
    3. Onur Mutlu
    4. Ken Mai
    Download (by DOI): 10.1109/DATE.2012.6176524
    BibTeX: conf/date/CaiHMM12
    DBLP: db/conf/date/date2012.html#CaiHMM12
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    Conference
    Name: 2012 Design, Automation Test in Europe Conference Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012 2012
    URL: http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6171057
    DBLP: db/conf/date/date2012.html