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Understanding Reduced-Voltage Operation in Modern DRAM Devices: Experimental Characterization, Analysis, and Mechanisms.

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    Title: Understanding Reduced-Voltage Operation in Modern DRAM Devices: Experimental Characterization, Analysis, and Mechanisms.
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    Date: 2017
    Publication type: Conference paper
    Authors:
    No. First name Last name Show
    1. Kevin K. Chang
    2. Abdullah Giray Yaglikçi
    3. Saugata Ghose
    4. Aditya Agrawal
    5. Niladrish Chatterjee
    6. Abhijith Kashyap
    7. Donghyuk Lee
    8. Mike O'Connor
    9. Hasan Hassan
    10. Onur Mutlu
    Download (by DOI): 10.1145/3078505.3078590
    BibTeX: conf/sigmetrics/ChangYGACKLOHM17
    DBLP: db/conf/sigmetrics/sigmetrics2017.html#ChangYGACKLOHM17
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    Conference
    Name: Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017 2017
    URL: http://doi.acm.org/10.1145/3078505
    DBLP: db/conf/sigmetrics/sigmetrics2017.html