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Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization.

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    Title: Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization.
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    Date: 2016
    Publication type: Conference paper
    Authors:
    No. First name Last name Show
    1. Kevin K. Chang
    2. Abhijith Kashyap
    3. Hasan Hassan
    4. Saugata Ghose
    5. Kevin Hsieh
    6. Donghyuk Lee
    7. Tianshi Li
    8. Gennady Pekhimenko
    9. Samira Manabi Khan
    10. Onur Mutlu
    Download (by DOI): 10.1145/2896377.2901453
    BibTeX: conf/sigmetrics/ChangKHGHLLPKM16
    DBLP: db/conf/sigmetrics/sigmetrics2016.html#ChangKHGHLLPKM16
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    Conference
    Name: Proceedings of the 2016 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Science, Antibes Juan-Les-Pins, France, June 14-18, 2016 2016
    URL: http://doi.acm.org/10.1145/2896377
    DBLP: db/conf/sigmetrics/sigmetrics2016.html