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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

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    Title: Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.
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    Date: 2014
    Publication type: Conference paper
    Authors:
    No. First name Last name Show
    1. Yixin Luo
    2. Sriram Govindan
    3. Bikash Sharma
    4. Mark Santaniello
    5. Justin Meza
    6. Aman Kansal
    7. Jie Liu
    8. Badriddine M. Khessib
    9. Kushagra Vaid
    10. Onur Mutlu
    Download (by DOI): 10.1109/DSN.2014.50
    BibTeX: conf/dsn/LuoGSSMKLKVM14
    DBLP: db/conf/dsn/dsn2014.html#LuoGSSMKLKVM14
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    Conference
    Name: 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2014, Atlanta, GA, USA, June 23-26, 2014 2014
    URL: http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6900116
    DBLP: db/conf/dsn/dsn2014.html