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    Conference
    Name: 2012 Design, Automation Test in Europe Conference Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012 2012
    URL: http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6171057
    DBLP: db/conf/date/date2012.html
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    Conference paper
    Yu Cai, Erich F. Haratsch, Onur Mutlu, Ken Mai.
    Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis.
    2012 Design, Automation Test in Europe Conference Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012 2012 (0) 2012
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