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    Conference
    Name: Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013 2013
    URL: http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6507370
    DBLP: db/conf/date/date2013.html
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    Conference paper
    Yu Cai, Erich F. Haratsch, Onur Mutlu, Ken Mai.
    Threshold voltage distribution in MLC NAND flash memory: characterization, analysis, and modeling.
    Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013 2013 (0) 2013
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