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    Journal
    Name: IEEE Design Test
    Year: 2016
    Volume: 33
    Number: 1
    DBLP: db/journals/dt/dt33.html
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    Journal article
    Amir Yazdanbakhsh, Bradley Thwaites, Hadi Esmaeilzadeh, Gennady Pekhimenko, Onur Mutlu, Todd C. Mowry.
    Mitigating the Memory Bottleneck With Approximate Load Value Prediction.
    IEEE Design Test 2016, Volume 33 (0) 2016
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