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    Journal
    Name: IEEE Micro
    Year: 2016
    Volume: 36
    Number: 1
    DBLP: db/journals/micro/micro36.html
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    Conference paper
    Onur Mutlu, Richard A. Belgard, Thomas R. Gross, Norman P. Jouppi, John L. Hennessy, Steven A. Przybylski, Chris Rowen, Yale N. Patt, Wen-Mei W. Hwu, Stephen W. Melvin, Michael Shebanow, Tse-Yu Yeh, Andy Wolfe.
    Common Bonds: MIPS, HPS, Two-Level Branch Prediction, and Compressed Code RISC Processor.
    IEEE Micro 2016, Volume 36 (0) 2016
    Journal article
    Onur Mutlu, Richard A. Belgard, Nick Tredennick, Mike Schlansker.
    The 2014 MICRO Test of Time Award Winners: From 1978 to 1992.
    IEEE Micro 2016, Volume 36 (0) 2016
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    Your query returned 2 matches in the database.