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    Conference
    Name: Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017 2017
    URL: http://doi.acm.org/10.1145/3078505
    DBLP: db/conf/sigmetrics/sigmetrics2017.html
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    Below you find the publications assigned to this venue.

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    Conference paper
    Donghyuk Lee, Samira Manabi Khan, Lavanya Subramanian, Saugata Ghose, Rachata Ausavarungnirun, Gennady Pekhimenko, Vivek Seshadri, Onur Mutlu.
    Design-Induced Latency Variation in Modern DRAM Chips: Characterization, Analysis, and Latency Reduction Mechanisms.
    Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017 2017 (0) 2017
    Conference paper
    Kevin K. Chang, Abdullah Giray Yaglikçi, Saugata Ghose, Aditya Agrawal, Niladrish Chatterjee, Abhijith Kashyap, Donghyuk Lee, Mike O'Connor, Hasan Hassan, Onur Mutlu.
    Understanding Reduced-Voltage Operation in Modern DRAM Devices: Experimental Characterization, Analysis, and Mechanisms.
    Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017 2017 (0) 2017
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